Micsig MOIP350P/Gen3

Fibre optic insulated probe with 50:1 / 5000:1 tips

Max. diff. voltage range ± 25 V / ± 2500 V using standard tips
Rise time ≤ 1.75 ns
Bandwidth 350 MHz
1 % accuracy
Less than 0.3 mVrms noise
Power supply: DC 12 V
The length of the fiber-optic cable and the voltage range are custimizable

1 year warranty

No.: Micsig MOIP350P/Gen3

Free shipping within Germany and to our neighboring EU countries! Shipping charges apply to all other countries.

In stock

4,999.- € net (VAT Details)

5,948.81 € incl. 19% VAT

Description

The SigOFIT Gen 3 MOIP350P fiber-optic-isolated probe enables the measurement of low and high voltages with a bandwidth of 200 MHz and a common-mode level of up to 85 kVpk. Thanks to Micsig’s exclusive SigOFIT™ optical isolation technology, the SigOFIT probe is laser-driven and delivers extremely high common-mode rejection ratio (CMRR) and isolation voltage. Unlike conventional differential probes, which can measure only high-voltage signals, the SigOFIT probe enables the measurement of differential signals in voltage ranges from ±0.01 V to ±20 kV. This achieves a full measurement range and a very high signal-to-noise ratio. Third-generation semiconductor devices, such as SiC and GaN, are capable of switching high voltages in a matter of nanoseconds. This generates high-energy, high-frequency harmonics.

The use of high-quality coaxial attenuation tips and industry-standard MCX and MMCX connectors perfectly suppresses the oscillations in the SigOFIT probes caused by high-frequency common-mode noise. Unlike previous-generation probes, the SigOFIT Gen 3 series enables calibration-free measurements and requires no automatic zero adjustment. This reduces setup time and allows engineers to begin measurements immediately, while maintaining excellent accuracy and long-term stability. In addition, the MOIP200P probe features a very low input impedance of < 3 pF, a very high common-mode rejection ratio of up to 122 dB, and a highly accurate DC gain of 1%.

Specification	MOIP1000P not yet available	MOIP500P not yet available	MOIP350P	MOIP200P
Bandwidth	1 GHz	500 MHz	350 MHz	200 MHz
Rise time	≤ 450 ps	≤ 800 ps	≤ 1 ns	≤ 1.75 ns
CMRR	DC: 180 dB; 1 GHz: 108 dB	DC: 180 dB; 500 MHz: 114 dB	DC: 180 dB; 350 MHz: 118 dB	DC: 180 dB; 200 MHz: 122 dB
Differential Voltage Range	Standard: OP50 (MMCX), ±25 V OP5000 (MCX), ±2500 V Other test ranges customizable.	Standard: OP50 (MMCX), ±25 V OP5000 (MCX), ±2500 V Other test ranges customizable.	Standard: OP50 (MMCX), ±25 V OP5000 (MCX), ±2500 V Other test ranges customizable.	Standard: OP50 (MMCX), ±25 V Other test ranges customizable.
Noise	<0.3 mVrms	<0.3 mVrms	<0.3 mVrms	<0.3 mVrms
DC Gain Accuracy	1%	1%	1%	1%
Common Mode Voltage Range	85 kVpk	85 kVpk	85 kVpk	85 kVpk
Power Supply	DC 12 V	DC 12 V	DC 12 V	DC 12 V
Fiber cable length	2 m (Customizable)	2 m (Customizable)	2 m (Customizable)	2 m (Customizable)
Interface	Universal BNC	Universal BNC	Universal BNC	Universal BNC

You can find all technical data here

The combination of probe and attenuation tip determines the probe's technical specifications. To find the right tip for your intended application, it is important to correctly determine the key parameters: differential voltage range, maximum input voltage, and input resistance. If you are unsure, we recommend contacting our technical support team.

Compatible attenuator tips for the MOIP200P Gen 3 and MOIP350P Gen 3 models

Attenuator Model	Jack type	Attenuation ratio	Voltage range	Non-destructive voltage (max.)	Input impedance
OP20-3	MMCX	20:1 @ 0 dB 2:1 @ 20 dB	±10 V ±1 V	1000 Vpk	4.47 MΩ \|\| ≤ 4 pF
OP50-3	MMCX	50:1 @ 0 dB 5:1 @ 20 dB	±25 V ±2.5 V	1000 Vpk	4.19 MΩ \|\| ≤ 2 pF
OP100-3	MMCX	100:1 @ 0 dB 10:1 @ 20 dB	±50 V ±5 V	1000 Vpk	4.10 MΩ \|\| ≤ 2 pF
OP200-3	MCX	200:1 @ 0 dB 20:1 @ 20 dB	±100 V ±10 V	2500 Vpk	8 MΩ \|\| ≤ 1 pF
OP500-3	MCX	500:1 @ 0 dB 50:1 @ 20 dB	±250 V ±25 V	2500 Vpk	5 MΩ \|\| ≤ 1 pF
OP1000-3	MCX	1000:1 @ 0 dB 100:1 @ 20 dB	±500 V ±50 V	2500 Vpk	20.94 MΩ \|\| ≤ 1 pF
OP2000-3	MCX	2000:1 @ 0 dB 200:1 @ 20 dB	±1000 V ±100 V	2500 Vpk	20.52 MΩ \|\| ≤ 1 pF
OP5000-3	MCX	5000:1 @ 0 dB 500:1 @ 20 dB	±2500 V ±250 V	2500 Vpk	40.82 MΩ \|\| ≤ 1 pF
OP10000-3	LCX	10000:1 @ 0 dB 1000:1 @ 20 dB	±5000 V ±500 V	8000 Vpk	40.82 MΩ \|\| ≤ 1 pF

Present True Signal

SigOFIT probe has highest common mode rejection ratio, or CMRR, up to 128dB at 100MHz, over 100dB at 1GHz. It's the ultimate referee of signal fidelity measured by other voltage probes.

Highest Accuracy

The SigOFIT optical-fiber isolated probe delivers highest test accuracy. It has excellent amplitude-frequency characteristics, DC gain accuracy ≤1 %, while noise ≤ 0.45 mVrms. Zero drift <0.1 % (works 5 mins later), gain drift also <1 %.

Best Probe for Third-Gen Semiconductor

SiC & GaN device can switch high voltages in a few nanoseconds, the signal may have high-energy high-frequency harmonics. Even at the highest bandwidth, the SigOFIT probe still have nearly 100dB CMRR, perfectly suppressed the oscillation caused by high-frequency common-mode noise, no redundant components. It's the best choice for 3rd-gen semiconductor test & measurement.

Safe to Test GaN

The test leads of SigOFIT probe are short and with coaxial cable transmission, has less than 2.5pF input capacitance, very safe to test GaN.

When the working parameters of the device are already in the critical state of explosive, there will be nearly 2.5pF more capacitance added when connected to the DUT, safety hence is not guaranteed.

Wide Measurement Range

Unlike traditional differential probes can only test high-voltage signals, SigOFIT probe can be used with different attenuator tips to test differential mode signals from ±0.1 V to ±8,000 V, achieve full-range output and very high signal-to-noise ratio.