The SMM3000X features 6½-digit resolution, output capability of up to ±210 V DC voltage, ±3.03 A DC current, and ±10.5 A pulsed current, with programming and measurement resolution down to 10 fA / 100 nV, and a maximum acquisition rate of 100,000 points/s.
It supports four-quadrant operation, enabling simultaneous sourcing and measurement for closed-loop source–measure operations on DUTs. It can function as a voltage source, current source, voltmeter, ammeter, and ohmmeter, and also supports pulse generation and arbitrary waveform output, making it an ideal platform for characterizing semiconductors and other nonlinear devices and materials.
The SMM3000X is designed to meet the precision testing needs of third-generation semiconductors, advanced optoelectronic devices, and emerging materials, while also significantly accelerating development cycles for new energy batteries and high-density integrated circuits. By improving both test efficiency and measurement accuracy, provides a powerful foundation for new product development and innovation.