Name: TekBox TBPS01 Near field probes set
Brand: TekBox
SKU: 8936120675007
Availability: InStock

The probes are utilised in the near field of sources of electromagnetic radiation. The purpose of these tools is to locate and identify potential sources of interference within the building blocks of electronic assemblies.

The probes function in a manner analogous to that of wide-bandwidth antennas, thereby acquiring radiated emissions from components, PCB traces, housing apertures or gaps, and any other components that could be emitting RF. The probes are generally connected to a spectrum analyser. The rapid scanning of the probe over the surface of a PCB assembly or housing facilitates the expeditious identification of locations that emit electromagnetic radiation.

The adoption of a probe with reduced dimensions facilitates the identification of the origin of the emissions with greater precision. It is imperative to note that supplementary applications encompass RF immunity tests. These are conducted by means of feeding a RF signal into the probe and subsequently radiating it into any circuit sections that may be susceptible. Moreover, the probes can be utilised in the domain of repair or debugging to identify issues in RF signal chains through contactless measurement of RF signal levels.

A further application is the non-invasive measurement of RF building blocks, including modulators and oscillators. The measurement of frequency, phase noise and spectral components can be achieved in conjunction with a low-noise preamplifier.