Micsig Probe MOIP01P

Description

Model	MOIP01P	MOIP02P	MOIP03P	MOIP05P	MOIP08P	MOIP10P
Bandwidth	100 MHz	200 MHz	350 MHz	500 MHz	800 MHz	1 GHz
Rise time	≤3.5 ns	≤1.75 ns	≤1 ns	≤700 ps	≤438 ps	≤350 ps
CMRR	DC: 180 dB 100 MHz: 128 dB	DC: 180 dB 200 MHz: 122 dB	DC: 180 dB 350 MHz: 118 dB	DC: 180 dB 500 MHz: 114 dB	DC: 180 dB 800 MHz: 110 dB	DC: 180 dB 1 GHz: 108 dB
"Output Voltage Range	2.5 V - 5,000 V	2.5 V - 5,000 V	1.25 V - 5,000 V	0.1 V - 5,000 V	0.1 V - 5,000 V	0.1 V - 5,000 V
Noise	<1.46 mVrms	<1.46 mVrms	<1.46 mVrms	<450 μVrms	<450 μVrms	<450 μVrms
SMA Input Impedance	1MΩ / 10pF	1MΩ / 10pF	1MΩ / 10pF	1MΩ / 10pF	1MΩ / 10pF	1MΩ / 10pF
Propagation delay	15.42 ns (2 m fiber length)	15.42 ns (2 m fiber length)	15.42 ns (2 m fiber length)	16 ns (2 m fiber length)	16 ns (2 m fiber length)	16 ns (2 m fiber length)
Power supply	USB Type-C, DC: 5V	USB Type-C, DC: 5V	USB Type-C, DC: 5V	USB Type-C, DC: 5V	USB Type-C, DC: 5V	USB Type-C, DC: 5V
DC Gain accuracy	1 %	1 %	1 %	1 %	1 %	1 %
Common mode voltage range	60 kVpk	60 kVpk	60 kVpk	60 kVpk	60 kVpk	60 kVpk

Attenuating tips

Model No.	Standard Tip(s)	Optional Tip(s)
MOIP01P MOIP02P	OP10-2	OP20-2, OP500-2, OP1000-2 *More on request
MOIP03P MOIP05P	OP20-5 OP1000-5	OP50-5, OP2000-5 *More on request
MOIP08P MOIP10P	OP20-1G OP1000-1G	OP50-1G, OP2000-1G *More on request

Attenuation

Model	Attenuation
OP10-2	10:1, ±25 V
OP20-2	20:1, ±50 V
OP500-2	500:1, ±1250 V
OP1000-2	1000:1, ±2500 V
OP20-5	20:1, ±25 V
OP5-5	50:1, ± 62,5 V
OP1000-5	1000:1, ±1250 V
OP2000-5	2000:1, ±2500 V
OP20-1G	20:1, ±25 V
OP50-1G	50:1, ±62,5 V
OP1000-1G	1000:1, ±1250 V
OP2000-1G	2000:1, ±2500 V

Present True Signal

SigOFIT probe has highest common mode rejection ratio, or CMRR, up to 128dB at 100MHz, over 100dB at 1GHz. It's the ultimate referee of signal fidelity measured by other voltage probes.

Highest Accuracy

The SigOFIT optical-fiber isolated probe delivers highest test accuracy. It has excellent amplitude-frequency characteristics, DC gain accuracy ≤1 %, while noise ≤ 0.45 mVrms. Zero drift <0.1 % (works 5 mins later), gain drift also <1 %.

Best Probe for Third-Gen Semiconductor

SiC & GaN device can switch high voltages in a few nanoseconds, the signal may have high-energy high-frequency harmonics. Even at the highest bandwidth, the SigOFIT probe still have nearly 100dB CMRR, perfectly suppressed the oscillation caused by high-frequency common-mode noise, no redundant components. It's the best choice for 3rd-gen semiconductor test & measurement.

Safe to Test GaN

The test leads of SigOFIT probe are short and with coaxial cable transmission, has less than 2.5pF input capacitance, very safe to test GaN.

When the working parameters of the device are already in the critical state of explosive, there will be nearly 2.5pF more capacitance added when connected to the DUT, safety hence is not guaranteed.

Wide Measurement Range

Unlike traditional differential probes can only test high-voltage signals, SigOFIT probe can be used with different attenuator tips to test differential mode signals from ±0.1V to ±5000V, achieve full-range output and very high signal-to-noise ratio.