Name: Siglent SDS7804AP
Brand: Siglent
Availability: BackOrder

Innovative Tools. Excellent Service.

service@batronix.com

+49 4342 90786-30

Private Customer | Germany | EN

Description

The SDS7000AP series digital storage oscilloscopes are available in bandwidths of 6 GHz and 8 GHz, have sample rate of 20 GSa/s at each channel, maximum record length of up to 2 Gpts/ch and display up to 4 analog channels + 16 digital channels mixed signal analysis ability.

The Siglent SDS7804AP employs Siglent’s SPO technology with a maximum waveform capture rate of up to 1.000.000 wfm/s, 256 level intensity grading display function plus a color temperature display mode. It also employs an innovative digital trigger system with high sensitivity and low jitter.

The trigger system supports multiple powerful triggering modes including serial bus triggering. Tools such as History waveform recording, Search and Navigate functions, Mask Test, Bode Plot, Power Analysis and Eye /Jitter Analysis allow for extended waveform records to b e captured, stored, and analyzed.

An impressive array of measurement and math capabilities, options for a 50 MHz arbitrary waveform generator, as well as serial decoding are also features of the Siglent SDS7804AP.

Additional functionality is provided by the combination of optional hardware and software:

USB decoding with the USB 2.0 test device FX-USB2 and the software SDS7000A-USB2
USB compliance test with the USB 2.0 test device FX-USB2 and the software SDS7000A-CT-USB2
Ethernet compliance test with the FX-ETH test device and either the SDS7000A-CT-100BASE-T or SDS7000A-CT-1000BASE-T software
Ethernet compliance test specifically for the automotive sector with the FX-AMETH test device and either the SDS7000A-CT-100BASE-T1 or SDS7000A-CT-1000BASE-T1 software

The large 15.6’’ display capacitive touch screen supports multi touch gestures, with the addition of user friendly UI design, can greatly improve the operation efficiency.

It also supports mouse control, and remote web control over LAN.

Model	SDS7000A	SDS7000AP
Analog channels	4 + EXT	4 + EXT
Bandwidth	3, 4, 6, 8 GHz 8 GHz / 6GHz models limited to 4 GHz in 3 or 4 channels modes	6, 8 GHz @ all channels
Sample rate (Max.)	20 GSa/s (dual-channel) 10 GSa/s (3 or 4 channels)	20 GSa/s @ all channels
Vertical Resolution	12-bit Up to 16-bit in ERES mode	12-bit Up to 16-bit in ERES mode
Memory depth (Max.)	Standard: 500 Mpts/ch Optional: 1 Gpts/ch in dual-channel mode	Standard: 1 Gpts/ch Optional: 2 Gpts/ch in one-channel mode
Waveform capture rate (Max.)	1,000,000 wfm/s	1,000,000 wfm/s
Trigger type	Edge, Slope, Pulse width, Window, Runt, Interval, Dropout, Pattern, Video, Qualified, Nth edge, Setup/hold, Delay, Serial	Edge, Slope, Pulse width, Window, Runt, Interval, Dropout, Pattern, Video, Qualified, Nth edge, Setup/hold, Delay, Serial
Serial trigger and decode	Standard: I2C, SPI, UART, CAN, LIN Optional: CAN FD, FlexRay, I2S, MIL-STD-1553B, SENT, Manchester(decode only), ARINC429, USB 2.0 (decode only)	Standard: I2C, SPI, UART, CAN, LIN Optional: CAN FD, FlexRay, I2S, MIL-STD-1553B, SENT, Manchester (decode only), ARINC429, USB 2.0 (decode only)
Digital channel	16-channel; maximum sample rate up to 1 GSa/s; record length up to 50 Mpts	16-channel; maximum sample rate up to 1 GSa/s; record length up to 50 Mpts
Waveform generator (optional)	Built-in, frequency up to 50 MHz, 125 MSa/s sample rate, 16 kpts waveform memory	Built-in, frequency up to 50 MHz, 125 MSa/s sample rate, 16 kpts waveform memory
Probe (Standard)	500 MHz, 1 probe supplied for each channel	500 MHz, 1 probe supplied for each channel
Display	15.6” HD TFT-LCD with capacitive touch screen (1920*1080)	15.6” HD TFT-LCD with capacitive touch screen (1920*1080)

Models

SDS7000A	Bandwidth	Channel	Logic Analyzer	Waveform generator
SDS7304A H12	3 GHz	4	Option	Option
SDS7404A H12	4 GHz	4	Option	Option
SDS7604A H12	6 GHz	4	Option	Option
SDS7804A H13	8 GHz	4	Option	Option

SDS7000AP	Bandwidth	Channel	Logic Analyzer	Waveform generator
SDS7604AP	6 GHz	4	Option	Option
SDS7804AP	8 GHz	4	Option	Option

You will find the specifications of the SDS7000A/P series here.

Eye/Jitter Analysis

The Siglent SDS7304A H12 supports eye diagram and jitter analysis measurement. It can automatically extract the embedded reference clock from serial data and create the eye diagram. Measurement on multiple eye/jitter parameters is provided. Mask test on eye diagrams is supported.

Up to 1.000.000 wfm/s waveform update rate

With a waveform update rate of up to 1.000.000 wfm/s, the Siglent SDS7304A H12 can easily capture low-probability events.

Record length of up to 1 Gpts/ch

Utilizing a hardware-based Zoom technique and record length up to 1 Gpts, users can select a slower timebase without compromising the sample rate and then quickly zoom in to focus on the area of interest.

Trigger zone

Trigger Zone is available for advanced triggering.

Measurement for all relevant parameters and parameter statistics

Parameter measurements includes 4 categories: vertical, horizontal, miscellaneous and channel delay providing a total of 50+ different types of measurements. Measurements can be performend within a specified gate period. Measurements on math, reference and history frames are supported.

Search and navigate

The Siglent SDS7304A H12 can find events within a record and history based on user specified trigger conditions. Navigate browses through events flagged by search, plays back history frames or continuosly moves the delay position on long records (useful in zoom view).

Serial bus decode

In addition to the decoder lanes correlated to the waveform, bus protocol information can be displayed in tabular form. I2C, SPI, UART, CAN, LIN, CAN FD, FlexRay, I2S, MIL-STD-1553B, ARINC429, USB 2.0 and SENT are supported.

Hardware-based high speed mask test function

The Siglent SDS7304A H12 utilizes a hardware-based mask test function, performing up to 18000 Pass / Fail decisions each second. It is easy to generate user defined test templates which the signal trace can be continuously compared to. The failed frames can be automatically stored as history frames or screen shots, making it suitable for long term signal monitoring or automated production line testing.