R&S® RTE1204

The larg display 26.4 cm (10.4") with a resolution of 1024 × 768 pixel, provides a capacitive touchscreen to quickly navigate in pop-up menus and a touch function to easily adjust scaling, to zoom in or to move a waveform – works just like your smartphone.

The 8-bit A/D converter provides 16-bit vertical resolution with the "high definition mode". You get sharper waveforms with more signal details. 50 Msample memory depth is available on each channel if all channels are active. When interleaved, 200 Msample are available. This captures longer signal sequences for more analysis results.

The R&S® RTE1204 gives users more than just an oscilloscope. It also includes a logic analyzer, protocol analyzer and power analyzer.

Dedicated operating modes for frequency analysis, mask tests and long data acquisitions are also integrated. Debugging all kinds of electronic systems is easy and efficient – and satisfies the all-important rule of investment protection at a very attractive price.

You will find the specifications of the RTE1000 series here.

Special Features

High definition mode

Zoomed-in peak of a sine wave: the high definition mode is not activated. Only the quantization levels can be seen in the zoom window. When the high definition mode is switched on, the zoom window shows that another very low-amplitude sine wave is superimposed on the signal.

One million waveforms/s

Due to the high acquisition rate of one million waveforms per second, R&S® RTE1204 oscilloscopes find rare signal faults very quickly.

Rohde & Schwarz SmartGrid function

The user can drag&drop waveforms and result windows on the screen. The Rohde & Schwarz SmartGrid function helps users arrange multiple diagrams or tabs on the screen. The size of individual diagrams can be further optimized by dragging the edges of the windows.

Mask Tests

R&S® RTE1204 masks consist of up to eight segments. Hardware implementation keeps the acquisition rate high, and mask violations are quickly found.

FFT function

The R&S® RTE1204 FFT function offers accuracy, speed, functionality and ease of use.

Serial protocol

Identifying errors within a serial protocol with the R&S® RTE1204 search function. All events are summarized in a table for easy navigation between different events. Selected events can be zoomed for detailed analysis.

Representation of an ADC ramp signal

Ramp signal of a 4-bit ADC with analog and digital channels, and an SPI bus signal with digital channels.

Logarithmic display of the frequency axis

Logarithmic display of the frequency axis with the spectrum analysis option for wideband analysis (up to 2 GHz) of a 3.33 MHz disturbance signal.

Spectrum analysis option

Spectrum display of a time varying signal in the frequency domain. Frequency peaks are automatically detected and their variance over time is displayed in a color-coded spectrogram.

Gated FFT

Gated FFT displays the spectrum for defined time segments of the acquired signal. The two time segments that have undergone FFT processing are highlighted in gray (the resulting spectra are displayed on the left and right below). Gated FFT makes it possible to correlate intermittent EMI emissions to the time domain signal. The red box shows the part of the spectrum caused by an unwanted emission, and the green boxes show a part of the spectrum that is constant and therefore present in both spectra.